DiRefl: Direct Inversion Reflectometry

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The Direct Inversion Reflectometry (DiRefl) application generates a scattering length density (SLD) profile of a thin film or free form sample using two neutron scattering datasets without the need to perform a fit of the data. DiRefl also has a simulation capability for creating datasets from a simple model description of the sample material.

DiRefl applies phase reconstruction and direct inversion techniques to analyze the reflectivity datasets produced by the two neutron scattering experiments performed on a single or multi-layer sample sandwiched between incident and substrate layers whose characteristics are known. The only setup difference between the runs is that the user changes the material of one of the surrounding layers. Output from DiRefl is in the form of a SLD profile graph and other supporting plots that can be saved or printed. In addition, the user can load, edit, and save model information, load reflectometry datasets, and adjust several parameters that affect the qualitative results of the analysis.