The Direct Inversion Reflectometry (DiRefl) application generates a scattering length density (SLD) profile of a thin film or free form sample using two neutron scattering datasets without the need to perform a fit of the data. DiRefl also has a simulation capability for creating datasets from a simple model description of the sample material.
| Release: | 1.0.12 |
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| Date: | May 04, 2011 |
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