Direct Inversion Reflectometry

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The Direct Inversion Reflectometry (DiRefl) application generates a scattering length density (SLD) profile of a thin film or free form sample using two neutron scattering datasets without the need to perform a fit of the data. DiRefl also has a simulation capability for creating datasets from a simple model description of the sample material.

Release:1.0.12
Date:May 04, 2011

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