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From reflectometry.org
Reflectometry Information Source
![Q_x = \frac{2 \pi}{\lambda} \left[ \cos \theta_i - \cos \theta_f \right]](/wiki/images/math/9/0/a/90aaa57cffdac48fc39aa517233f9a77.png)
![Q_z = \frac{2 \pi}{\lambda} \left[ \sin \theta_i + \sin \theta_f \right]](/wiki/images/math/b/1/3/b130db6d54884a59f793f1343c7677cf.png)
X-ray reflectometry (XRR) and neutron reflectometry (NR) are techniques for measuring the structure of thin films.
Grazing incidence small angle scattering (GISAS) measures the reflected signal away from the purely specular reflection angle. It can be used to measure large scale in-plane structures.
This site is maintained by volunteers from the reflectometry community, and contains information about the available instruments, their data formats, and software used to analyze reflectometry data.
- Neutron and X-ray reflectometers.
- Data Formats
- Reflectometry Software
- Conferences and Workshops
Other information may be added over time, such as:
- reflectometry theory, such as tutorial materials from the various summer schools,
- an in depth description of the reduction and analysis process,
- abstracts and bib. references for important papers, and the papers themselves where copyright allows,
- file format descriptions for various instruments
Enjoy!
