This list may not be exhaustive or up-to-date. Please contact us with your beamline details or, alternatively, you can edit the list directly by becoming a member of the GitHub group that administers this webpage: contact Andrew.

Table of Synchrotron X-ray reflectometry instruments

At synchrotron and free electron laser Light Sources there are many instruments that can be used for X-ray reflectometry. Please find a list of suggestions below. For a complete list of all x-ray scattering beamlines in Europe please visit, Way For Light database. (please note that the Way for Light database includes instruments that may use the term reflectometry to refer to some spectroscopy techniques rather than in sense used here).

Diamond Light Source has a good set of definitions of the various techniques that are possible at synchrotrons. Acronyms used in the table below are consistent with these definitions.

Facility Country Instrument Reflectometry on Liquid surfaces Polarisation Energy Range Other techniques
APS USA 15-ID: Liquid Interface Scattering Yes horizontal (linear) 5-70keV GID, GISAXS & more
Diamond UK I07 Surface and Interface Diffraction Yes horizontal (linear) 4-45keV GIXD, GISAXS
Diamond UK I10 BLADE No linear or circular 0.4-2keV XAS, XMCD, Soft X-ray Diffraction & more
Diamond UK I16 Materials and Magnetism No linear or circular 3.3-25keV GIXD, WAXS & more
ESRF (German CRG) France BM20 ROBL No horizontal (linear) 3.5-35keV GIXD & Resonant Anomalous X-ray Reflectometry, XAS, XES
ESRF (Spansih CRG) France BM25 SpLine No horizontal (linear) 5-35keV GIXD, XPS
ESRF (UK CRG) France BM28 XMaS No horizontal (linear) 2.4-15keV GIXD, GISAXS, SAXS, XAS & more
ESRF (French CRG) France BM32 InterFace Beamline No horizontal (linear) 7-30keV GIXD, XAS & more
ESRF France ID10 Soft interfaces and coherent scattering Yes horizontal (linear) 7-24keV GIXD, GISAXS & more
ESRF France ID31 High-energy beamline for buried interface structure and materials processing Yes horizontal (linear) 21-150keV GIXD, GISAXS & more
Indus-2 India BL-3 Soft x-ray reflectivity beamline No horizontal (linear) 100-1500 eV TEY
Indus-2 India BL-13 Grazing Incidence X-ray Scattering No horizontal (linear) 5-11 keV GIXD, GISAXS & XRD
NSLS2 (BNL) USA 11-BM Complex Materials Scattering No horizontal (linear) 10 - 17 keV (GI)SAXS/WAXS
NSLS2 (BNL) USA 12-ID Soft Matter Interfaces Yes horizontal (linear) 2.05 - 24 keV (GI)SAXS/WAXS, XRD
NSLS2 (BNL) USA 4-ID Integrated In situ and Resonant Hard X-ray Studies No horizontal (linear) 6 - 23 keV (GI)SAXS/WAXS
NSLS2 (BNL) USA 6-BM Beamline for Materials Measurement No horizontal (linear) 4 - 23 keV GIXD, GISAXS, resonant x-ray scattering
Photon Factory (KEK) Japan BL-18B Indian Beamline at Photon Factory Yes horizontal (linear) 8-19 keV GIXD & XRD
PETRA III (DESY) Germany P07 The High Energy Materials Science Yes horizontal (linear) 33-200keV XRD & more
PETRA III (DESY) Germany P08: LISA Yes horizontal (linear) 5.4-29.4keV GID, GISAXS & more
SOLEIL France SIXS Surfaces interfaces x-ray Scattering No horizontal (linear) 5 -20 keV XRD, GIXD & more
SOLEIL France SIRIUS Soft Interfaces and Resonant Investigation No horizontal (linear) 1.4 -13 keV GIXD, GISAXS, XAS & more
SPring-8 Japan BL13XU Surface and Interface Structures No horizontal (linear) 6-50 keV GIXD
SPring-8 Japan BL19B2 Engineering Science I No horizontal (linear) 5-72 keV GIXD, SAXS, XRD
SPring-8 Japan BL46XU Engineering Science III No horizontal (linear) 6-35 keV GIXD, XRD & more
SSRF China O2U2 Yes horizontal (linear) 4.8-28 keV XRD, GIXD & more